Infrared Images of Shock-Heated Tin.

McCluskey, C. W. ; White, M. D. ; Turley, W. D. ; Stevens, G. D. ; Veeser, L. R.

Technical Information Center Oak Ridge Tennessee

关键词: Tin;    Shock heating;    Interferometry;    Thermal shock;   

RP-ID  :  DE2004834160

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

High-resolution, gated infrared images were taken of tin samples shock heated to just below the 505 K melting point. Sample surfaces were either polished or diamond-turned, with grain sizes ranging from about 0.05 to 10 mm. A high explosive in contact with a 2-mm-thick tin sample induced a peak sample stress of 18 GPa. Interferometer data from similarly-driven tin shots indicate that immediately after shock breakout the samples spall near the free (imaged) surface with a scab thickness of about 0.1 mm.