Optical Damage Threshold of Silicon for Ultrafast Infrared Pulses.

Cowan, B. M.

Technical Information Center Oak Ridge Tennessee

关键词: Silicon;    Measurements;    Motivation;    Experimental setups;    Diagnostics;   

RP-ID  :  DE2007920281

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

We present measurements of the optical damage threshold of crystalline silicon in air for ultrafast pulses in the near infrared. The wavelengths tested span a range from the telecommunications band at 1550 nm, extending to 2260 nm. We discuss the motivation for the measurements and give theoretical context. We then describe the experimental setup, diagnostics, and procedure. The results show a breakdown threshold of 0:2 J=cm2 at 1550 nm and 1.06 ps FWHM pulse duration, and a weak dependence on wavelength.