Polarization Studies of CdZnTe Detectors using Synchrotron X-Ray Radiation.

Camarda, G. S. ; Hossain, A. ; James, R. B. ; Cui, Y. ; Bolotnikov, A. E.

Technical Information Center Oak Ridge Tennessee

关键词: Cadmium tellurides;    Zinc tellurides;    Polarization;    Radiation detectors;    Defects;   

RP-ID  :  DE2008910362

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

New results on the effects of small-scale defects on the charge-carrier transport in single-crystal CdZnTe (CZT) material were produced. We conducted detailed studies of the role of Te inclusions in CZT by employing a highly collimated synchrotron x-ray radiation source available at Brookhaven's National Synchrotron Light Source (NSLS). We were able to induce polarization effects by irradiating specific areas with the detector. These measurements allowed the first quantitative comparison between areas that are free of Te inclusions and those with a relatively high concentration of inclusions. The results of these polaration studies will be reported.