X-Ray Backlighting for the National Ignition Facility.

Landen, O. L. ; Fraley, D. R. ; Glendinning, S. G. ; Logory, L. M. ; Bell, P. M. ; Kich, J. A. ; Lee, F. D. ; Bradley, D. K. ; Kalantar, D. H. ; Back, C. A. ; Turner, R. E. ; Price, D. E.

Technical Information Center Oak Ridge Tennessee

关键词: High energy physics;    Diagnostics;    Radiography;    High density;    National Ignition Facility;   

RP-ID  :  DE200515013240

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

X-ray backlighting is a powerful tool for diagnosing a large variety of high-energy-density phenomena. Traditional area backlighting techniques used at Nova and Omega cannot be extended efficiently to NIF-scale. New, more efficient backlighting sources and techniques are required and have begun to show promising results. These include a backlit-pinhole point-projection technique, pinhole and slit arrays, distributed polychromatic sources, and picketfence backlighters. In parallel, there have been developments in improving the data SNR and hence quality by switching from film to CCD-based recording media and by removing the fixed-pattern noise of MCP-based cameras.