科技报告详细信息
Toward On-the-fly Multiscale Modeling of Damage Localization. | |
Rudd, R. E. ; Jefferson, D. | |
Technical Information Center Oak Ridge Tennessee | |
关键词: Materials; Damage; Localization; Porosity; Voids; | |
RP-ID : DE200515014340 | |
学科分类:工程和技术(综合) | |
美国|英语 | |
来源: National Technical Reports Library | |
【 摘 要 】
We present a preliminary investigation of damage localization as a model problem for adaptive sampling. The fine-scale material response involving void nucleation and growth is computed on the fly as needed at the coarse scale.
【 预 览 】
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DE200515014340.pdf | 182KB | download |