We have conducted an experiment in which the temperature and the wavelength dependent emissivity of a shocked surface has been measured. In the past, only the thermal emission from the shocked surface has been measured. The lack of knowledge of the emissivity as a function of wavelength leads to uncertainty in converting the measured emission spectrum into a surface temperature. We have developed a technique by which we are able to calculate both the emissivity of the shocked surface over a range of relevant wavelengths and the temperature of the surface. We use a multi-channel spectrometer in combination with a pulsed light source having a known spectrum of infrared radiation. Two separate techniques using a pulse of reflected radiation are employed and described.