Contaminant Analysis of Polycrystalline and Single Crystal Niobium Used in Accelerator Cavities.

Stevie, F. A. ; Zhu, Z. ; Griffis, D. P. ; Myneni, G. R. ; Kneisel, P.

Technical Information Center Oak Ridge Tennessee

关键词: Niobium;    Accelerators;    Mass spectrometry;    Oxides;    Contaminants;   

RP-ID  :  DE2005859453

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

Secondary Ion Mass Spectrometry (SIMS) can characterize the surface and near surface of Nb used in accelerator cavities. Results show Nb oxide in the 2-3 nm range, a depleted H concentration in the oxide compared with the bulk, and N, C, O lower in an annealed single crystal sample than several polycrystalline samples. Other metallic contaminants are primarily at the surface, but tantalum is distributed uniformly through the material.