Electro-Optic Sampling of Single Electron Beam Bunches of Ultrashort Duration.

Bolton, P. R. ; Clendenin, J. E. ; Dowell, D. H.

Technical Information Center Oak Ridge Tennessee

关键词: Electron beams;    Beam bunching;    Electrooptics;    Detection;    Beam dynamics;   

RP-ID  :  DE2004826639

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

The effect of ultrafast electron beam bunch dynamics on single shot electro-optic sampling detection schemes is examined. It is shown that ultrashort electron bunch fields of adequate magnitude can dynamically impose additional bandwidth on laser probe pulses. The significance of this effect is evaluated by comparing the dynamics of the laser probe to that of the nonradiative field of a single electron bunch for a given crystal material. Dynamic effects can be distinguished with ultrafast temporal resolution of the transmitted probe spectrum.