NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Topper, Alyson D ; O'Bryan, Martha V ; Casey, Megan C ; Lauenstein, Jean-Marie ; Stansberry, Scott D ; Campola, Michael J ; Wilcox, Edward P ; Ladbury, Ray L ; Berg, Melanie D ; Wyrwas, Edward J(Science Systems and Applications, Inc (SSAI), Lanham, MD, United States)

关键词: COMMERCIAL OFF-THE-SHELF PRODUCTS;    EXTRATERRESTRIAL RADIATION;    GROUND TESTS;    PROTON DAMAGE;    SINGLE EVENT EFFECTS (SEE);    SPACECRAFT ELECTRONIC EQUIPMENT;    TOTAL IONIZING DOSE;   

RP-ID  :  GSFC-E-DAA-TN70510

学科分类：电子与电气工程

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

Total ionizing dose, displacement damage dose, and single-event effect testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, bipolar devices, and FPGAs.