Cracking Failures in Ceramic Capacitors and the Existing Screening and Qualification Procedures

Teverovsky, Alexander

关键词: CERAMICS;    CRACKS;    CRACKING (FRACTURING);    CAPACITORS;    FAILURE ANALYSIS;    STRESS ANALYSIS;    PHOTOACOUSTIC MICROSCOPY;    QUALIFICATIONS;   

RP-ID  :  GSFC-E-DAA-TN69938

学科分类：力学，机械学

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

This presentation gives a review of recent project failures caused by cracks in ceramic capacitors and discusses deficiencies of the existing screening and qualification procedures that can reveal the propensity to cracking and effects of soldering stresses.