System and Method of Optical Axis Alignment Monitor and Feedback Control for a Spectrometer

Marx, Catherine [Inventor]Linares, Irving [Inventor]Shu, Peter [Inventor]Smith, James [Inventor]

关键词: OPTICAL EQUIPMENT;    SPECTROMETERS;    ALIGNMENT;    FEEDBACK CONTROL;    CONTROL STABILITY;    PATENTS;    POSITION ERRORS;    IMAGE RESOLUTION;   

RP-ID  :  US-Patent-10,113,908, US-Patent-Appl-SN-15/714,568

学科分类：航空航天科学

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

The present invention relates to an apparatus and method of a real-time, monitoring and control feedback system for a 2-D spectrometer application, to correct for active optical axis pointing misalignments or jitter (i.e., tip, tilt), that result in degraded scientific image integrity, unwanted spatial crosstalk and image blurring artifacts which severely limit the applications for high resolution spectrometer image data. The present invention provides a unique system architecture which ensures the most direct optical axis motion detection and control capability that will enable sub-pixel image motion monitoring and boresight control stability, thus, maximizing the science image quality.