Energy Analysis Method for Hidden Damage Detection

Campbell Leckey, Cara A [Inventor]

关键词: COMPOSITE MATERIALS;    DEFECTS;    PATENTS;   

RP-ID  :  US-Patent-10,006,886, US-Patent-Appl-SN-14/709,887

学科分类：复合材料

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

A method of detecting internal defects in composites or other multilayer materials includes generating a wavefield on a surface of the material. Wavefield data is collected from the wavefield on the surface, and the measured wavefield data is processed to provide measured energy data. The method may include generating simulated or predicted energy data for the multilayer material that is compared to the simulated energy data to determine if the multilayer material has internal defects or damage below the surface. The method can be utilized to detect and/or quantify damage or other defects that are "hidden" by damage that is closer to the surface of the material.