Corrosion Failure in Electronic Devices for Aerospace Application

Pierre, Michelle S ; Montgomery, Eliza L [Personal Name]

关键词: ELECTROCHEMICAL CORROSION;    FAILURE;    OPTICAL COUPLING;    CHIPS (ELECTRONICS);    PINS;    SURFACE DEFECTS;    RUPTURING;    CRACKING (FRACTURING);    DISCOLORATION;    CONTAMINANTS;    MINIATURE ELECTRONIC EQUIPMENT;    ELECTROLYTIC CELLS;    ADHESION;    GOLD;    NICKEL;    SCANNING ELECTRON MICROSCOPY;    PHOTOELECTRON SPECTROSCOPY;    X RAY SPECTROSCOPY;   

RP-ID  :  KSC-E-DAA-TN55180

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

Corrosion of complex electronic systems is a growing and expensive concern. New materials and technology are constantly being introduced to increase performance of devices. There are many factors that can induce a corrosive environment during the various stages of manufacturing, processing, transport, and storage of these devices. The scope of this paper was to identify potential causes for the corrosion failure of optocoupler batches being used in launch applications. Optical microscope with surface profile measurements, scanning electron microscopy (SEM), energy-dispersive X-ray spectrometry (EDS), and X-ray photoelectron spectroscopy (XPS) were used to identify and analyze the source of these failure. These studies revealed that the loss of adhesion between the electrolytic plated gold and nickel layers is the critical area that traps impurity ions into the chip allowing for blisters to form along the pins of the optocoupler.