Quantitative Microanalysis with high Spatial Resolution: Application of FEG-DTEM XEDS Microanalysis to the Characterization of Complex Microstructures in Irradiated Low Alloy Steet

Williams, D.B., Watanabe, M. and Burke, M.G.

Bettis Atomic Power Laboratory

关键词: Hardening;    Spectrometers;    Microanalysis;    Irradiation;    36 Materials Science;   

DOI  :  10.2172/938978
RP-ID  :  B-T-3412
RP-ID  :  AC11-98PN38206
RP-ID  :  938978

美国|英语

来源: UNT Digital Library

【 摘 要 】

To assist in the characterization of microstructural changes associated with irradiation damage in low alloy steels, the technique of quantitative x-ray mapping using a field emission gun scanning transmission electron microscope (FEG-STEM) equipped with an x-ray energy Dispersive spectrometer (XEDS) has been employed. Quantitative XEDS microanalyses of the matrix and grain boundaries of irradiated specimens have been compared with previous quantitative analyses obtained using 3D-Atom Probe Field-Ion Microscopy (3D-APFIM). In addition, the FEG-STEM XEDS maps obtained from the irradiated steel have revealed the presence of 2 to 3 nm Ni-enriched 'precipitates' in the matrix, which had previously been detected using 3D-APFIM. These quantitative FEG-STEM XEDS results represent the first direct and independent microchemical corroboration of the 3D-APFIM results showing ultra-fine irradiation-induced hardening features in low alloy steel.