Sensitivity Analysis of the DARHT-II 2.5MV/2kA Diode

Henestroza, Enrique

Lawrence Berkeley National Laboratory

关键词: Cathodes;    Electrodes;    Sensitivity Analysis;    32;    Computerized Simulation;   

DOI  :  10.2172/928866
RP-ID  :  LBNL--62296
RP-ID  :  DE-AC02-05CH11231
RP-ID  :  928866

美国|英语

来源: UNT Digital Library

【 摘 要 】

This report summarizes the study of the tolerance limits on the assembly of the cathode and the Pierce electrode for the DARHT-II diode (2.5 MV, 2 kA case), performed through a series of computer simulations using the PIC code WARP [1]. We have considered sources of beam quality degradation like the errors in axial and transverse positioning, and the size of the radial gap between the cathode and the Pierce electrode (shroud). The figure of merit was chosen to be the RMS beam (edge) emittance at a distance of 1 meter from the cathode, as defined by {var_epsilon}{sub x} = 4 {beta}{gamma} {radical}(-{sup 2}) {center_dot}. The analysis shows that to position the cathode at the correct axial and transverse location is more important than the size of the radial gap.