Final Report - SRNL Agreement #AC51296V SEM, FIB, TEM Studies of CZT Samples

Bradley, J ; Dai, Z R ; Graham, G A ; Teslich, N E

Lawrence Livermore National Laboratory

关键词: 99 General And Miscellaneous//Mathematics, Computing, And Information Science;    Phase Studies;    Scanning Electron Microscopy;    Tellurium;    Zinc;   

DOI  :  10.2172/924965
RP-ID  :  UCRL-TR-234106
RP-ID  :  W-7405-ENG-48
RP-ID  :  924965

美国|英语

来源: UNT Digital Library

【 摘 要 】

The aims of this study are: (1) to characterize the surfaces of samples 3-7-8-3 and 4-1-3 using SEM, FIB and TEM techniques; (2) identify raised surface features; (3) prepare FIB-TEM lift-out sections from identified raised surfaces; and (4) perform detailed TEM characterization of FIB Sections. Focusing on the composition and crystallinity of the phases within the sections, including impurities.