Predicting the reliability of electronic circuits.

Loescher, Douglas H.

Sandia National Laboratories

关键词: Probability;    Reliability (Engineering);    Electronic Circuits;    42 Engineering;    Integrated Circuits-Reliability.;   

DOI  :  10.2172/919204
RP-ID  :  SAND2004-2377
RP-ID  :  AC04-94AL85000
RP-ID  :  919204

美国|英语

来源: UNT Digital Library

【 摘 要 】

Procedures to predict the reliability of electrical circuits are discussed. Three cases are introduced and discussed. In Case 1, an analyst predicts the probability of any failure in the intended relations between circuit inputs and circuit outputs. In Case 2, an analyst predicts the probability that specified unintended outputs would occur. In Case 3, an analyst considers coupling between circuits. Logic models are given for the three cases, and sources of failure probabilities of components are mentioned. Methods of analysis are given, software tools are mentioned, and recommendations for presentation and review of results are discussed.