High Brightness, Laser-Driven X-ray Source for Nanoscale Metrology and Femtosecond Dynamics

Siders, C W ; Crane, J K ; Semenov, V ; Betts, S ; Kozioziemski, B ; Wharton, K ; Wilks, S ; Barbee, T ; Stuart, B ; Kim, D E ; An, J ; Barty, C

Lawrence Livermore National Laboratory

关键词: 42 Engineering;    X-Ray Sources;    X-Ray Tubes;    Brightness;    Thin Films;   

DOI  :  10.2172/902319
RP-ID  :  UCRL-TR-228409
RP-ID  :  W-7405-ENG-48
RP-ID  :  902319

美国|英语

来源: UNT Digital Library

【 摘 要 】

This project developed and demonstrated a new, bright, ultrafast x-ray source based upon laser-driven K-alpha generation, which can produce an x-ray flux 10 to 100 times greater than current microfocus x-ray tubes. The short-pulse (sub-picosecond) duration of this x-ray source also makes it ideal for observing time-resolved dynamics of atomic motion in solids and thin films.