科技报告详细信息
| A Method to Measure the Flatness of the LSST Focal Plane Assembly in Situ | |
| Langeveld, Willy | |
| Stanford Linear Accelerator Center | |
| 关键词: Measuring Methods; Cryostats; Other,Other; Accuracy; Accelerator Facilities Other,Other; | |
| DOI : 10.2172/878027 RP-ID : SLAC-TN-05-047 RP-ID : AC02-76SF00515 RP-ID : 878027 |
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| 美国|英语 | |
| 来源: UNT Digital Library | |
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【 摘 要 】
In this note I describe an inexpensive and simple laser-based method to measure the flatness of the LSST focal plane assembly (FPA) in situ, i.e. while the FPA is inside its cryostat, at -100 C and under vacuum. The method may also allow measurement of the distance of the FPA to lens L3, and may be sensitive enough to measure gravity- and pressure-induced deformations of L3 as well. The accuracy of the method shows promise to be better than 1 micron.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 878027.pdf | 511KB |
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