Hardware Testing of the BaBar Drift Chamber Electronics Upgrade (SULI paper)

Littlejohn, Bryce ; Coll., /Principia ; Chu, Yiwen ; /MIT ; Wiik, Liv ; /SLAC

Stanford Linear Accelerator Center

关键词: Dead Time;    Mockup;    43 Particle Accelerators;    Drift Chambers;    Performance Testing;   

DOI  :  10.2172/877992
RP-ID  :  SLAC-TN-05-072
RP-ID  :  AC02-76SF00515
RP-ID  :  877992

美国|英语

来源: UNT Digital Library

【 摘 要 】

The BaBar drift chamber provides position, timing, and dE/dx measurements for charged decay products of the {Upsilon}(4S) resonance at 10.58 GeV. Increasing data collection rates stemming from higher PEP II luminosities and background have highlighted dead time problems in the drift chamber's data acquisition system. A proposed upgrade, called Phase II, aims to solve the problem with the introduction of rewritable, higher-memory firmware in the DAQ front-end electronics that lowers dataflow through the system. After fabrication, the new electronics components were tested to ensure proper function and reliability before installation in the detector. Some tests checked for successful operation of individual components, while others operated entire sections of the upgraded system in a mockup drift chamber environment. This paper explains the testing process and presents results regarding performance of the upgrade electronics.