Final technical report: DE FG02-98ER45688

Tonner, Brian P.

Graduate School, University of Wisconsin-Milwaukee, Milwaukee, WI (United States)

关键词: Electronic Structure;    Surfaces;    X-Ray Spectroscopy;    X-Ray Spectroscopy;    Absorption Spectroscopy;   

DOI  :  10.2172/807786
RP-ID  :  NONE
RP-ID  :  FG02-98ER45688
RP-ID  :  807786

美国|英语

来源: UNT Digital Library

【 摘 要 】

Research using the Advanced Light Source Spectro-microscopy facility is described. Three closely related techniques, x-ray photoelectron spectroscopy, x-ray absorption spectroscopy, and x-ray fluorescence spectroscopy, have become widely accepted as important tools for the study of the chemical composition and electronic properties of surfaces, overlayers, and interfaces. There is now a major effort to push these spectroscopic techniques into a new realm of applications with very high spatial resolution, at and below 1 micron. This results in a new set of probes which can create images of chemical composition with great subtlety. The field is growing rapidly as high brightness sources of x-rays become available. This 6 month project was used to initiate research applications of soft x-ray spectro-microscopes at the Advanced Light Source. Due to its short duration, only preliminary results were obtained. The term ''spectromicroscopy'' is an ugly and unwieldy word to impose on an experimental endeavor, but it has been adopted by a number of disciplines and is likely to remain in use for some time. The word is obviously a contraction of the phrase ''spectroscopic microscopy,'' but there is also a distinction sometimes made between this, and the reverse combination, ''microscopic spectroscopy'', or ''microspectroscopy''. Microspectroscopy is a spectroscopic measurement with a small probe beam, which is usually fixed in position on the sample. Spectromicroscopy refers to the case where an image can be formed from the spatial dependence of the features in some spectrum.