SINGLE-CRYSTAL SAPPHIRE OPTICAL FIBER SENSOR INSTRUMENTATION

Wang, A. ; Pickrell, G. ; May, R.

National Energy Technology Laboratory (U.S.)

关键词: Birefringence;    Performance Testing;    Polarization;    Optical Fibers;    Stability;   

DOI  :  10.2172/801212
RP-ID  :  FC26-99FT40685--03
RP-ID  :  FC26-99FT40685
RP-ID  :  801212

美国|英语

来源: UNT Digital Library

【 摘 要 】

Testing results of a Broadband Polarized-Light Interferometric (BPLI) high temperature sensor is presented in this report. The state of polarization of the broadband incident light is modulated by the high birefringence of the sapphire disk used as the sensing element and becomes a wavelength-encoded signal, which is detected by an Optical Spectrum Analyzer (OSA) and then is processed by a computer, an internally developed algorithm is employed to directly calculate gap changes between two optical path between two orthogonal linear polarizations of light in a sapphire phase retarder, its phase retardation changes with temperature. The great advantages of this sensor are its simplicity and long-term stability in harsh environment. The system has been laboratory successfully tested up to 1600 C.