Scintillator Evaluation for High-Energy X-Ray Diagnostics

Lutz, S. S. ; Baker, S. A.

Bechtel Nevada Corporation

关键词: 46 Instrumentation Related To Nuclear Science And Technology;    X-Ray Radiography;    Quantum Efficiency;    Lutetium Compounds;    Resolution;   

DOI  :  10.2172/790063
RP-ID  :  DOE/NV/11718--653
RP-ID  :  AC08-96NV11718
RP-ID  :  790063

美国|英语

来源: UNT Digital Library

【 摘 要 】

This report presents results derived from a digital radiography study performed using x-rays from a 2.3 MeV, rod-pinch diode. Detailed is a parameter study of cerium-doped lutetium ortho-silicate (LSO) scintillator thickness, as it relates to system resolution and detection quantum efficiency (DQE). Additionally, the detection statistics of LSO were compared with that of CsI(Tl). As a result of this study we found the LSO scintillator with a thickness of 3 mm to yield the highest system DQE over the range of spatial frequencies from 0.75 to 2.5 mm{sup -1}.