Transient Radiation Darkening Features in VISAR Window

Stevens, G. D. ; Moy, K. J.

Bechtel Nevada Corporation

关键词: Sapphire;    Windows;    Refractive Index;    36 Materials Science;    Radiation Effects;   

DOI  :  10.2172/788708
RP-ID  :  DOE/NV/11718--592
RP-ID  :  AC08-96NV11718
RP-ID  :  788708

美国|英语

来源: UNT Digital Library

【 摘 要 】

We have studied and characterized radiation-induced changes in the index of refraction of materials used in Z experiments. Interferometric measurements of the radiation-induced change in the real part, n, of the complex index of refraction, N = n + iK, have been made in lithium fluoride (LiF), sapphire, and fused silica samples. Our results indicate that the index changes are small, with {delta}n/n {approx} 1 x 10{sup -5}/kGy. In addition, we have characterized the dose dependence of the radiation-induced transient radiation darkening (TRD) of these materials, which is related to K, the imaginary part of the refractive index. We have also measured time-resolved spectral profiles of TRD in LiF and sapphire, and have examined the results in terms of known color centers and possible colloid aggregation.