科技报告详细信息
| Mechanical, Electrical, and Environmental Evaluation of Nano-Miniature Connectors | |
| Hilton, J.W. | |
| Kansas City Plant (U.S.) | |
| 关键词: Mechanical Properties; Plating; Performance Testing; Telemetry; Miniaturization; | |
| DOI : 10.2172/783946 RP-ID : KCP-613-6453 RP-ID : AC04-01AL66850 RP-ID : 783946 |
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| 美国|英语 | |
| 来源: UNT Digital Library | |
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【 摘 要 】
Because of their small size (0.025-inch spacing), nano-miniature connectors have been chosen for JTA telemetry applications. At the time they were chosen, extensive testing had not been done to determine the mechanical, electrical, and environmental characteristics of these connectors at the levels required for use by weapon systems. Since nano-miniature connectors use some unique plating and wire crimping processes not used in most design agency connectors, it was decided that these properties should be tested thoroughly. This report describes the results of that testing.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 783946.pdf | 3606KB |
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