科技报告详细信息
Upgrade and Operation of the Second Generation Two-Modulator Generalized Ellipsometry Microscope (2-MGEM2) | |
Jellison Jr, Gerald Earle ; Hunn, John D ; Breninger, Andrew H. | |
Oak Ridge National Laboratory | |
关键词: Agr; Triso; 2-Mgem; | |
DOI : 10.2172/1076912 RP-ID : ORNL/TM-2013/162 RP-ID : DE-AC05-00OR22725 RP-ID : 1076912 |
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美国|英语 | |
来源: UNT Digital Library | |
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1076912.pdf | 8049KB | download |