科技报告详细信息
Measurement-induced Nonlinearity in Linear Optics
Scheel, Stefan ; Nemoto, Kae ; Munro, William J. ; Knight, Peter L.
HP Development Company
关键词: quantum information;    generation of nonlinearities;    quantum gates;    conditional measurements;   
RP-ID  :  HPL-2003-123
学科分类:计算机科学(综合)
美国|英语
来源: HP Labs
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【 摘 要 】

We investigate the generation of nonlinear operators with single photon sources, linear optical elements and appropriate measurements of auxiliary modes. We provide a framework for the construction of useful single-mode and two-mode quantum gates necessary for all-optical quantum information processing. We focus our attention generally on using minimal physical resources while providing a transparent and algorithmic way of constructing these operators. Notes: Stefan Scheel and Peter L. Knight Quantum Optics and Laser Science, Blackett Laboratory, Imperial College London, Prince Consort Road, London SW7 2BW, U.K Kae Nemoto, School of Informatics, Dean Street, Bangor University Bangor LL57 1UT, U.K 13 Pages

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