科技报告详细信息
Diagnosing Performance Overheads in the Xen Virtual Machine Environment
Menon, Aravind ; Santos, Jose Renato ; Turner, Yoshio ; Janakiraman, G. (John) ; Zwaenepoel, Willy
HP Development Company
关键词: Virtual Machine;    performance analysis;    statistical profiling;    Xen;    OProfile;   
RP-ID  :  HPL-2005-80
学科分类:计算机科学(综合)
美国|英语
来源: HP Labs
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【 摘 要 】

Virtual Machine (VM) environments (e.g., VMware and Xen) are experiencing a resurgence of interest for diverse uses including server consolidation and shared hosting. An application's performance in a virtual machine environment can differ markedly from its performance in a nonvirtualized environment because of interactions with the underlying virtual machine monitor and other virtual machines. However, few tools are currently available to help debug performance problems in virtual machine environments. In this paper, we present Xenoprof, a system-wide statistical profiling toolkit implemented for the Xen virtual machine environment. The toolkit enables coordinated profiling of multiple VMs in a system to obtain the distribution of hardware events such as clock cycles and cache and TLB misses. We use our toolkit to analyze performance overheads incurred by networking applications running in Xen VMs. We focus on networking applications since virtualizing network I/0 devices is relatively expensive. Our experimental results quantify Xen's performance overheads for network I/0 device virtualization in uni- and multi- processor systems. Our results identify the main sources of this overhead which should be the focus of Xen optimization efforts. We also show how our profiling toolkit was used to uncover and resolve performance bugs that we encountered in our experiments which caused unexpected application behavior. Notes: Copyright ACM. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. Original paper published in and presented at the First ACM/USENIX Conference on Virtual Execution Environments (VEE'05), 11-12 June 2005, Chicago, Illinois, USA 11 Pages

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