System to Measure Thermal Conductivity and Seebeck Coefficient for Thermoelectrics

Park, Yeonjoon ; King, Glen C. ; Nagavalli, Anita ; Choi, Sang H. ; Kim, Hyun-Jung ; Skuza, Jonathan R.

PID  :  NTRS Document ID: 20130001757
RP-ID  :  L-20213
RP-ID  :  LF99-15831
RP-ID  :  NASA/TM-2012-217791

学科分类：工程和技术（综合）

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

The Seebeck coefficient, when combined with thermal and electrical conductivity, is an essential property measurement for evaluating the potential performance of novel thermoelectric materials. However, there is some question as to which measurement technique(s) provides the most accurate determination of the Seebeck coefficient at elevated temperatures. This has led to the implementation of nonstandardized practices that have further complicated the confirmation of reported high ZT materials. The major objective of the procedure described is for the simultaneous measurement of the Seebeck coefficient and thermal diffusivity within a given temperature range. These thermoelectric measurements must be precise, accurate, and reproducible to ensure meaningful interlaboratory comparison of data. The custom-built thermal characterization system described in this NASA-TM is specifically designed to measure the inplane thermal diffusivity, and the Seebeck coefficient for materials in the ranging from 73 K through 373 K.