New Insights into Dissipation in the Electron Layer During Magnetic Reconnection

Ji, H. ; Ren, Y, ; Yamada, M. ; Dorfman, S. ; Daughton, W. ; Gerhardt, S. P.

关键词: ELECTRONS;    MAGNETIC RECONNECTION;    THICKNESS Space Plasma Physics;    Numerical Simulation;    Magnetic Reconnection;   

DOI  :  10.2172/958410
RP-ID  :  PPPL-4334
PID  :  OSTI ID: 958410
Others  :  TRN: US0902866

学科分类：原子、分子光学和等离子物理

美国|英语

来源: SciTech Connect

【 摘 要 】

ELECTRON DISSIPATION IN RECONNECTION Detailed comparisons are reported between laboratory observations of electron scale dissipation layers near a reconnecting X-line and direct two-dimensional full-particle simulations. Many experimental features of the electron layers, such as insensitivity to the ion mass, are reproduced by the simulations; the layer thickness, however, is about 3 - 5 times larger than the predictions. Consequently, the leading candidate 2D mechanism based on collisionless electron nongyrotropic pressure is insuffcient to explain the observed reconnection rates. These results suggest that, in addition to the residual collisions, 3D effects play an important role in electron-scale dissipation during fast reconnection.