Analytical models for total dose ionization effects in MOS devices.

Campbell, Phillip Montgomery ; Bogdan, Carolyn W.

关键词: AGING;    BUILDUP;    CHARGES;    DAMAGE;    DOSE RATES;    DOSES;    ELECTRIC POTENTIAL;    EMISSION;    EQUIPMENT;    HYDROGEN;    INTERFACES;    IONIZATION;    IONIZING RADIATIONS;    MOBILITY;    MOS TRANSISTORS;    OXIDES;    RADIATIONS;    SILICON;    TRAPPING;   

DOI  :  10.2172/1002109
RP-ID  :  SAND2008-5112
PID  :  OSTI ID: 1002109
Others  :  TRN: US201104%%145

学科分类：再生能源与代替技术

美国|英语

来源: SciTech Connect

【 摘 要 】

MOS devices are susceptible to damage by ionizing radiation due to charge buildup in gate, field and SOI buried oxides. Under positive bias holes created in the gate oxide will transport to the Si / SiO{sub 2} interface creating oxide-trapped charge. As a result of hole transport and trapping, hydrogen is liberated in the oxide which can create interface-trapped charge. The trapped charge will affect the threshold voltage and degrade the channel mobility. Neutralization of oxidetrapped charge by electron tunneling from the silicon and by thermal emission can take place over long periods of time. Neutralization of interface-trapped charge is not observed at room temperature. Analytical models are developed that account for the principal effects of total dose in MOS devices under different gate bias. The intent is to obtain closed-form solutions that can be used in circuit simulation. Expressions are derived for the aging effects of very low dose rate radiation over long time periods.