A test protocol to screen capacitors for radiation-induced charge loss.

Zarick, Thomas Andrew ; Hartman, E. Frederick

关键词: CAPACITORS;    DIELECTRIC MATERIALS;    IONIZING RADIATIONS;    SCREENS Dielectrics.;    Capacitors.;    Ionizing radiation.;    Radiation;    Ionizing-Adverse effects.;   

DOI  :  10.2172/940528
RP-ID  :  SAND2008-5577
PID  :  OSTI ID: 940528
Others  :  TRN: US200824%%282

学科分类：材料科学（综合）

美国|英语

来源: SciTech Connect

【 摘 要 】

This report presents a test protocol for screening capacitors dielectrics for charge loss due to ionizing radiation. The test protocol minimizes experimental error and provides a test method that allows comparisons of different dielectric types if exposed to the same environment and if the same experimental technique is used. The test acceptance or screening method is fully described in this report. A discussion of technical issues and possible errors and uncertainties is included in this report also.