Enhanced Functionality for Materials Analysis in the DTEM

N. D. Browning ; W. A. Schoeder ; J. C. H. Spence

关键词: CHEMICAL REACTIONS;    ELECTRON DIFFRACTION;    ELECTRON SOURCES;    ELECTRONS;    EXPLOSIONS;    LASERS;    OPTIMIZATION;    PROBES;    RESOLUTION;    SPATIAL RESOLUTION;    SYNCHROTRON RADIATION;    TRANSIENTS;    TRANSMISSION ELECTRON MICROSCOPY DTEM;    Materials Science;   

DOI  :  10.2172/977140
RP-ID  :  Final
PID  :  OSTI ID: 977140
Others  :  TRN: US1003112

学科分类：社会科学、人文和艺术（综合）

美国|英语

来源: SciTech Connect

【 摘 要 】

The recent explosion in the use of pump–probe studies on picosecond and shorter timescales to investigate structural and electronic phase transitions and the dynamics of chemical reactions has been based largely on laser–induced reactions coupled with laser interrogation techniques, or on laser induced reactions coupled with synchrotron radiation interrogation techniques. Much less attention has been given to approaches based on laser–induced (or electron–beam–induced) reactions coupled with electron interrogation methods, despite the fact that electron sources are brighter, and their interactions with matter stronger (thereby giving higher signal levels). The use of electrons as temporal probes has great potential for the study of complex transient events not only because of the high temporal resolution attainable by ultrafast electron diffraction (UED) but also the potential for direct high spatial resolution imaging using dynamic transmission electron microscopy (DTEM). However, taking this potential for electron interrogation methods and turning it into a routine nanoscale characterization technique requires several key aspects of the instrumentation used for electron microscopy/diffraction to be optimized. In this work, several approaches to instrument optimization for DTEM and UED (to be performed in the same instrument) are being addressed.