Efficient algorithms for mixed aleatory-epistemic uncertainty quantification with application to radiation-hardened electronics. Part I, algorithms and benchmark results.

Swiler, Laura Painton ; Eldred, Michael Scott

关键词: ALGORITHMS;    BENCHMARKS;    PERFORMANCE;    STATISTICS;    DATA COVARIANCES;    RADIATION HARDENING;    ELECTRONIC EQUIPMENT Statistics.;    Radiation effects-Monitoring.;    Epistemic Uncertainaty;   

DOI  :  10.2172/972887
RP-ID  :  SAND2009-5805
PID  :  OSTI ID: 972887
Others  :  TRN: US1001747

美国|英语

来源: SciTech Connect

【 摘 要 】

This report documents the results of an FY09 ASC V&V Methods level 2 milestone demonstrating new algorithmic capabilities for mixed aleatory-epistemic uncertainty quantification. Through the combination of stochastic expansions for computing aleatory statistics and interval optimization for computing epistemic bounds, mixed uncertainty analysis studies are shown to be more accurate and efficient than previously achievable. Part I of the report describes the algorithms and presents benchmark performance results. Part II applies these new algorithms to UQ analysis of radiation effects in electronic devices and circuits for the QASPR program.