Harmful Shunting Mechanisms Found in Silicon Solar Cells (Fact Sheet)

关键词: BREAKDOWN;    DEFECTS;    ELECTRIC POTENTIAL;    ELECTRICAL FAULTS;    ELECTROLUMINESCENCE;    FEEDBACK;    IMPURITIES;    MANUFACTURING;    OPTICAL FIBERS;    OPTICAL MICROSCOPY;    PROBES;    PRODUCTION;    SILICON;    SILICON SOLAR CELLS;    SOLAR CELLS;    SOLAR INDUSTRY;    SPATIAL DISTRIBUTION;    TOPOGRAPHY SOLAR CELLS;    SILICON;    PV;    Solar Energy - Photovoltaics;   

DOI  :  10.2172/1016431
RP-ID  :  NREL/FS-5200-51411
PID  :  OSTI ID: 1016431
Others  :  TRN: US201112%%418

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来源: SciTech Connect

【 摘 要 】

Scientists developed near-field optical microscopy for imaging electrical breakdown in solar cells and identified critical electrical breakdown mechanisms operating in industrial silicon and epitaxial silicon solar cells.