Finite-element analysis of the deformation of thin Mylar films due to measurement forces.

Baker, Michael Sean ; Robinson, Alex Lockwood ; Tran, Hy D.

关键词: ABSORPTION;    ACCURACY;    ANALYTICAL SOLUTION;    BEARINGS;    DEFORMATION;    MYLAR;    POLYETHYLENES;    POLYMERS;    PROCESSING;    PROCUREMENT;    PRODUCTION;    QUALITY CONTROL;    REFRACTIVE INDEX;    SHRINKAGE;    SIMULATION;    SOLVENTS;    TESTING;    THICKNESS;    THIN FILMS;   

DOI  :  10.2172/1034880
RP-ID  :  SAND2012-0186
PID  :  OSTI ID: 1034880
Others  :  TRN: US201205%%19

学科分类：材料科学（综合）

美国|英语

来源: SciTech Connect

【 摘 要 】

Significant deformation of thin films occurs when measuring thickness by mechanical means. This source of measurement error can lead to underestimating film thickness if proper corrections are not made. Analytical solutions exist for Hertzian contact deformation, but these solutions assume relatively large geometries. If the film being measured is thin, the analytical Hertzian assumptions are not appropriate. ANSYS is used to model the contact deformation of a 48 gauge Mylar film under bearing load, supported by a stiffer material. Simulation results are presented and compared to other correction estimates. Ideal, semi-infinite, and constrained properties of the film and the measurement tools are considered.