Sodium fast reactor safety and licensing research plan. Volume II.

Ludewig, H. (Brokhaven National Laboratory, Upton, NY) ; Powers, D. A. ; Hewson, John C. ; LaChance, Jeffrey L. ; Wright, A. (Argonne National Laboratory, Argonne, IL) ; Phillips, J. ; Zeyen, R. (Institute for Energy Petten, Saint-Paul-lez-Durance, France) ; Clement, B. (IRSN/DPAM.SEMIC Bt 702, Saint-Paul-lez-Durance, France) ; Garner, Frank (Radiation Effects Consulting, Richland, WA) ; Walters, Leon (Advanced Reactor Concepts, Los Alamos, NM) ; Wright, Steve ; Ott, Larry J. (Oak Ridge National Laboratory, Oak Ridge, TN) ; Suo-Anttila, Ahti Jorma ; Denning, Richard (Ohio State University, Columbus, OH) ; Ohshima, Hiroyuki (Japan Atomic Energy Agency, Ibaraki, Japan) ; Ohno, S. (Japan Atomic Energy Agency, Ibaraki, Japan) ; Miyhara, S. (Japan Atomic Energy Agency, Ibaraki, Japan) ; Yacout, Abdellatif (Argonne National Laboratory, Argonne, IL) ; Farmer, M. (Argonne National Laboratory, Argonne, IL) ; Wade, D. (Argonne National Laboratory, Argonne, IL) ; Grandy, C. (Argonne National Laboratory, Argonne, IL) ; Schmidt, R. ; Cahalen, J. (Argonne National Laboratory, Argonne, IL) ; Olivier, Tara Jean ; Budnitz, R. (Lawrence Berkeley National Laboratory, Berkeley, CA) ; Tobita, Yoshiharu (Japan Atomic Energy Agency, Ibaraki, Japan) ; Serre, Frederic (Centre d'%C3%94etudes nucl%C3%94eaires de Cadarache, Cea, France) ; Natesan, Ken (Argonne National Laboratory, Argonne, IL) ; Carbajo, Juan J. (Oak Ridge National Laboratory, Oak Ridge, TN) ; Jeong, Hae-Yong (Korea Atomic Energy Research Institute, Daejeon, Korea) ; Wigeland, Roald (Idaho National Laboratory, Idaho Falls, ID) ; Corradini, Michael (University of Wisconsin-Madison, Madison, WI) ; Thomas, Justin (Argonne National Laboratory, Argonne, IL) ; Wei, Tom (Argonne National Laboratory, Argonne, IL) ; Sofu, Tanju (Argonne National Laboratory, Argonne, IL) ; Flanagan, George F. (Oak Ridge National Laboratory, Oak Ridge, TN) ; Bari, R. (Brokhaven National Laboratory, Upton, NY) ; Porter D. (Idaho National Laboratory, Idaho Falls, ID) ; Lambert, J. (Argonne National Laboratory, Argonne, IL) ; Hayes, S. (Idaho National Laboratory, Idaho Falls, ID) ; Sackett, J. (Idaho National Laboratory, Idaho Falls, ID) ; Denman, Matthew R.

关键词: ACCIDENTS;    ANL;    BNL;    BURNERS;    COMPUTER CODES;    FAST REACTORS;    JAEA;    KAERI;    LAWRENCE BERKELEY LABORATORY;    LICENSING;    ORNL;    SAFETY;    SODIUM;    SOURCE TERMS;   

DOI  :  10.2172/1044967
RP-ID  :  SAND2012-4259
PID  :  OSTI ID: 1044967
Others  :  TRN: US1203585

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来源: SciTech Connect

【 摘 要 】

Expert panels comprised of subject matter experts identified at the U.S. National Laboratories (SNL, ANL, INL, ORNL, LBL, and BNL), universities (University of Wisconsin and Ohio State University), international agencies (IRSN, CEA, JAEA, KAERI, and JRC-IE) and private consultation companies (Radiation Effects Consulting) were assembled to perform a gap analysis for sodium fast reactor licensing. Expert-opinion elicitation was performed to qualitatively assess the current state of sodium fast reactor technologies. Five independent gap analyses were performed resulting in the following topical reports: (1) Accident Initiators and Sequences (i.e., Initiators/Sequences Technology Gap Analysis), (2) Sodium Technology Phenomena (i.e., Advanced Burner Reactor Sodium Technology Gap Analysis), (3) Fuels and Materials (i.e., Sodium Fast Reactor Fuels and Materials: Research Needs), (4) Source Term Characterization (i.e., Advanced Sodium Fast Reactor Accident Source Terms: Research Needs), and (5) Computer Codes and Models (i.e., Sodium Fast Reactor Gaps Analysis of Computer Codes and Models for Accident Analysis and Reactor Safety). Volume II of the Sodium Research Plan consolidates the five gap analysis reports produced by each expert panel, wherein the importance of the identified phenomena and necessities of further experimental research and code development were addressed. The findings from these five reports comprised the basis for the analysis in Sodium Fast Reactor Research Plan Volume I.