科技报告详细信息
| Doubly Curved Crystal Monochromatic XRF Instrumentation for Materials Characterization | |
| Havrilla, George J.1 | |
| [1] Los Alamos National Laboratory | |
| 关键词: Instrumentation Related to Nuclear Science & Technology(46) Analytical Chemistry; | |
| DOI : 10.2172/1088915 RP-ID : LA-UR-13-25793 PID : OSTI ID: 1088915 |
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| 美国|英语 | |
| 来源: SciTech Connect | |
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【 摘 要 】
Abstract Not Provided
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO201704180002273LZ | 369KB |  download |
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