科技报告详细信息
| Critical Current Metrology for Nb3Sn Conductor Development | |
| Goodrich, Loren F.1  | |
| [1] NIST | |
| 关键词: SUPERCONDUCTORS; CRITICAL CURRENT; STRAINS superconductors; critical current; strain; variable temperature measurements; high-field magnets; | |
| DOI : 10.2172/1110507 RP-ID : NIST Report Number: 687-14-02 PID : OSTI ID: 1110507 Others : Other: ER41701 |
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| 美国|英语 | |
| 来源: SciTech Connect | |
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【 摘 要 】
The research is focused on the variable temperature studies of high-performance Nb3Sn and other high-field conductors for the next-generation of HEP magnets.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO201704180000176LZ | 263KB |
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