科技报告详细信息
| Measuring Complementary Electronic Structure Properties of both Deposited and Gas Phase Clusters using STM, UPS, and PES: Size-Selected Clusters on Surfaces | |
| Bowen, Kit H. | |
| 关键词: Clusters; Electronic Properties; STM; PES; | |
| DOI : 10.2172/1122129 RP-ID : DOE-JHU-ER46558 PID : OSTI ID: 1122129 |
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| 学科分类:材料科学(综合) | |
| 美国|英语 | |
| 来源: SciTech Connect | |
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【 摘 要 】
In this project, we studied size-selected cluster interactions with surfaces, with other clusters on surfaces, and with external stimuli. These studies focused on mobility as a function of cluster size, surface morphologies as a function of composition and coverage, ion-induced modification and reactivity of clusters as a function of composition, the structural evolution of cluster cuboids culminating in the characterization of theoretically-predicted ???baby crystal??? clusters, and unusual fractal pattern formation due to deposition.
【 预 览 】
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