High Speed SPM of Functional Materials

Huey, Bryan D.¹ 

[1] Univ. of Connecticut, Storrs, CT (United States)

关键词: Atomic Force Microscopy;    Ferroelectric;    Multiferroic;    Thin Film Solar Cell;   

DOI  :  10.2172/1209681
RP-ID  :  DOE-UConn--5037
PID  :  OSTI ID: 1209681

美国|英语

来源: SciTech Connect

【 摘 要 】

The development and optimization of applications comprising functional materials necessitates a thorough understanding of their static and dynamic properties and performance at the nanoscale. Leveraging High Speed SPM and concepts enabled by it, efficient measurements and maps with nanoscale and nanosecond temporal resolution are uniquely feasible. This includes recent enhancements for topographic, conductivity, ferroelectric, and piezoelectric properties as originally proposed, as well as newly developed methods or improvements to AFM-based mechanical, friction, thermal, and photoconductivity measurements. The results of this work reveal fundamental mechanisms of operation, and suggest new approaches for improving the ultimate speed and/or efficiency, of data storage systems, magnetic-electric sensors, and solar cells.