Ultra-sensitive Magnetic Microscopy with an Atomic Magnetometer

Kim, Young Jin¹ 

[1] Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

关键词: MAGNETOMETERS;    MICROSCOPY;    RESOLUTION;    PERFORMANCE TESTING;    SENSITIVITY;    DATA ACQUISITION SYSTEMS;    ALKALI METALS;    ATOMS;   

DOI  :  10.2172/1212624
RP-ID  :  LA-UR--15-26553
PID  :  OSTI ID: 1212624
Others  :  TRN: US1500384

美国|英语

来源: SciTech Connect

【 摘 要 】

The PowerPoint presentation focused on research goals, specific information about the atomic magnetometer, response and resolution factors of the SERF magnetometer, FC+AM systems, tests of field transfer and resolution on FC, gradient cancellation, testing of AM performance, ideas for a multi-channel AM, including preliminary sensitivity testing, and a description of a 6 channel DAQ system. A few ideas for future work ended the presentation.