Campaign 1.7 Pu Aging. Development of Time of Flight Secondary Ion Mass Spectroscopy

Venhaus, Thomas J.¹ 

[1] Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

关键词: Secondary Ion Mass Spectroscopy Plutonium;   

DOI  :  10.2172/1214635
RP-ID  :  LA-UR--15-27011
PID  :  OSTI ID: 1214635

学科分类：材料科学（综合）

美国|英语

来源: SciTech Connect

【 摘 要 】

The first application of Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) to an aged plutonium surface has resulted in a rich set of surface chemistry data, as well as some unexpected results. FY15 was highlighted by not only the first mapping of hydrogen-containing features within the metal, but also a prove-in series of experiments using the system???s Sieverts Reaction Cell. These experiments involved successfully heating the sample to ~450 oC for nearly 24 hours while the sample was dosed several times with hydrogen, followed by an in situ ToF-SIMS analysis. During this year, the data allowed for better and more consistent identification of the myriad peaks that result from the SIMS sputter process. In collaboration with the AWE (U.K), the system was also fully aligned for sputter depth profiling for future experiments.