Investigation of the effect of substrate orientation on the structural, electrical and optical properties of n-type GaAs1-xBix layers grown by Molecular Beam Epitaxy

JOURNAL OF ALLOYS AND COMPOUNDS

卷:885

Article

Alhassan, Sultan^1,2  de Souza, Daniele³  Alhassni, Amra¹  Almunyif, Amjad¹  Alotaibi, Saud¹  Almalki, Abdulaziz¹  Alhuwayz, Maryam¹  Kazakov, Igor P.⁴  Klekovkin, Alexey, V⁴  Tsekhosh, Vladimir, I⁴  Likhachev, Igor A.⁵  Pashaev, Elkhan M.⁵  Souto, Sergio⁶  Gobato, Yara Galvao³  Al Saqri, Noor⁷  Avanco Galeti, Helder Vinicius⁸  Al Mashary, Faisal⁹  Albalawi, Hind¹⁰  Alwadai, Norah¹⁰  Henini, Mohamed¹ 

[1] Univ Nottingham, Sch Phys & Astron, Nottingham NG7 2RD, England

[2] Jouf Univ, Coll Sci, Sch Phys, Sakaka 746317365, Saudi Arabia

[3] Univ Fed Sao Carlos, Phys Dept, Sao Carlos, SP, Brazil

[4] Russian Acad Sci, PN Lebedev Phys Inst, GSP 1, Moscow 119991, Russia

[5] Kurchatov Inst, Natl Res Ctr, Moscow 123182, Russia

[6] Univ Sao Paulo, FZEA ZAB, Pirassununga, SP, Brazil

[7] Sultan Qaboos Univ, Coll Sci, Dept Phys, Muscat, Oman

[8] Univ Fed Sao Carlos, Elect Engn Dept, Sao Carlos, SP, Brazil

[9] Qassim Univ, Coll Sci, Dept Phys, Buraydah 14452, Saudi Arabia

[10] Princess Nourah Bint Abdulrahman Univ PNU, Coll Sci, Dept Phys, Riyadh 11671, Saudi Arabia

关键词: Dilute bismides;    Electrical properties;    Optical properties;    Doped semiconductor;    Structural disorder;    Defects;   

DOI  :  10.1016/j.jallcom.2021.161019

来源: Elsevier

【 摘 要 】

Current-Voltage (I-V), Capacitance-Voltage (C-V), Deep Level Transient Spectroscopy (DLTS), Laplace DLTS, Photoluminescence (PL) and Micro-Raman techniques have been employed to investigate the effect of the orientation of the substrates on the structural, electrically and optically active defects in dilute GaAs1-xBix epilayers structures having a Bi composition x = similar to 5.4%, grown by Molecular Beam Epitaxy (MBE) on (100) and (311)B GaAs planes. X-ray diffraction results revealed that the in-plane strain in the Ga(As,Bi) layer of the samples grown on (100)-oriented substrate (-0.0484) is significantly larger than that of the samples grown on (311)B-oriented substrate. The substrate orientation is found to have a noticeable impact on the Bi incorporation and the electrical properties of dilute GaAsBi Schottky diodes. The I-V characteristics showed that (100) Schottky diodes exhibited a larger ideality factor and higher barrier height compared with (311)B samples. The DLTS measurements showed that the number of electrically active traps were different for the two GaAs substrate orientations. In particular, three and two electron traps are detected in samples grown on (100) and (311)B GaAs substrates, respectively, with activation energies ranging from 0.12 to 0.41 eV. Additionally, one hole trap was observed only in sample grown on (100) substrates with activation energy 0.24 eV. The observed traps with small activation energies are attributed to Bi pair defects. The photoluminescence (PL) and Raman spectra have evidenced different compressive strain which affects considerably the optical properties. Furthermore, the PL spectra were also affected by different contributions of Bi- related traps which are different for different substrate orientation in agreement with DLTS results. (C) 2021 Elsevier B.V. All rights reserved.

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