| JOURNAL OF ALLOYS AND COMPOUNDS | 卷:800 |
| Structural and superconducting properties of Nb3Sn films grown by multilayer sequential magnetron sputtering | |
| Article | |
| Sayeed, Md Nizam1,2  Pudasaini, Uttar3  Reece, Charles E.4  Eremeev, Grigory4  Elsayed-Ali, Hani E.1,2  | |
| [1] Old Dominion Univ, Dept Elect & Comp Engn, Norfolk, VA 23529 USA | |
| [2] Appl Res Ctr, 12050 Jefferson Ave, Newport News, VA 23606 USA | |
| [3] Coll William & Mary, Dept Appl Sci, Williamsburg, VA 23185 USA | |
| [4] Thomas Jefferson Natl Accelerator Facil, Newport News, VA 23606 USA | |
| 关键词: Nb3Sn thin film; Multilayer sequential sputtering; Structure; Superconducting properties; | |
| DOI : 10.1016/j.jallcom.2019.06.017 | |
| 来源: Elsevier | |
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【 摘 要 】
Nb3Sn thin films are fabricated by sequential sputtering followed by annealing at 850-1200 degrees C in vacuum. The effects of the annealing temperature and time on the formation of Nb3Sn were examined. The film crystal structure, morphology, surface topography and composition were characterized by X-ray diffraction, field-emission scanning electron microscopy, atomic force microscopy, and energy dispersive X-ray spectroscopy analysis. The superconducting properties of the films were characterized by measuring the surface resistivity by the four-point probe method. The highest critical temperature T-c = 17.86 K was observed for the Nb3Sn films annealed at 950 degrees C for 3 h. When the films were annealed above 1000 degrees C for 3 h, Sn evaporation resulted in a Nb-rich film, degrading the superconducting performance. Annealing at 1200 degrees C for 3 h resulted in evaporation of Sn leaving less than 1% Sn on the surface, as detected by energy dispersive spectroscopy, and for that film a T-c of 7.9 K was observed. (C) 2019 Elsevier B.V. All rights reserved.
【 授权许可】
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【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 10_1016_j_jallcom_2019_06_017.pdf | 2127KB |
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