期刊论文详细信息
| JOURNAL OF ALGEBRA | 卷:481 |
| Defect of an extension, key polynomials and local uniformization | |
| Article | |
| Saturnino, Jean-Christophe San1  | |
| [1] Univ Toulouse III Paul Sabatier, Inst Math Toulouse, 118 Route Narbonne, F-31062 Toulouse 9, France | |
| 关键词: Defect; Valued fields; Local uniformization; Key polynomials; | |
| DOI : 10.1016/j.jalgebra.2017.02.023 | |
| 来源: Elsevier | |
PDF
|
|
【 摘 要 】
In this article, we prove that the defect of all simple extension of valued field is the product of the effective degrees of the complete set of key polynomials associated with. As a consequence, we obtain a local uniformization theorem for valuations of rank 1 centered on an equicharacteristic quasi excellent local domain satisfying some inductive assumptions of lack of defect. (C) 2017 Elsevier Inc. All rights reserved.
【 授权许可】
Free
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 10_1016_j_jalgebra_2017_02_023.pdf | 489KB |
PDF