| INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES | 卷:162 |
| Scratching of silicon surfaces | |
| Article | |
| Budnitzki, M.1  Kuna, M.1  | |
| [1] TU Bergakad Freiberg, Inst Mech & Fluid Dynam, Lampadiusstr 4, D-09599 Freiberg, Germany | |
| 关键词: Silicon; Scratching; Simulation; Phase transition; Wire sawing; Grinding; | |
| DOI : 10.1016/j.ijsolstr.2018.11.024 | |
| 来源: Elsevier | |
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【 摘 要 】
Nanoscale scratching of silicon surfaces is the elementary abrasive event for various machining techniques including fixed abrasive wire saw slicing, grinding, elliptical ultrasonic cutting and single-point diamond turning. The understanding of this process is essential for improving the surface quality and reducing sub-surface damage. Nanoscratching experiments are performed using a well characterized diamond tip geometry. The finite element method is employed in order to simulate the scratching process with a continuum constitutive model developed for phase transformation in silicon (Budnitzki, M., Kuna, M., 2016. Stress induced phase transitions in silicon. JMPS 95, 64-91). The required material parameters were determined from indentation experiments in a (111) single crystal Si wafer. The simulation results agree very well with data from scratch experiments without requiring additional calibration. (C) 2018 Elsevier Ltd. All rights reserved.
【 授权许可】
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【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 10_1016_j_ijsolstr_2018_11_024.pdf | 2146KB |
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