A biparametric perturbation method for the Foppl-von Karman equations of bimodular thin plates

JOURNAL OF MATHEMATICAL ANALYSIS AND APPLICATIONS

卷:455

Article

He, Xiao-Ting^1,2  Cao, Liang¹  Wang, Ying-Zhu¹  Sun, Jun-Yi^1,2  Zheng, Zhou-Lian^1,2 

[1] Chongqing Univ, Sch Civil Engn, Chongqing 400045, Peoples R China

[2] Chongqing Univ, Minist Educ, Key Lab New Technol Construct Cities Mt Area, Chongqing 400030, Peoples R China

关键词: Foppl-von Karman equations;    Bimodulus;    Biparametric perturbation method;    Selection of parameters;    Central deflection;    Loads;   

DOI  :  10.1016/j.jmaa.2017.06.046

来源: Elsevier

【 摘 要 】

In this study, a biparametric perturbation method is proposed to solve the Foppl-von Karman equations of bimodular thin plates subjected to a single load. First, by using two small parameters, one describes the bimodular effect and another stands for the central deflection, we expanded the unknown deflection and stress in double power series with respect to the two parameters and obtained the approximate analytical solutions under various edge conditions. Due to the diversity of selection of parameters and its combination, by using the bimodular parameter and the load as two perturbation parameters, we elucidated further the application of this method. The use of two sets of parameter schemes both can obtain satisfactory perturbation solutions; the numerical simulations also verify this idea. The results indicate that in a biparametric perturbation method, the selection and its combination of parameters may reflect the combined effects introduced by nonlinear factors. The method proposed in this study may be used for solving other mathematical equations established in some application problems. (C) 2017 Elsevier Inc. All rights reserved.

【 授权许可】

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