An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes

JOURNAL OF POWER SOURCES

卷:444

Article

Chen, Jian¹  Yang, Le²  Han, Yu¹  Bao, Yin-Hua³  Zhang, Kai-Lun¹  Li, Xiang⁴  Pang, Jing⁴  Chen, Hao-Sen¹  Song, Wei-Li¹  Wei, Yu-Jie⁵  Fang, Dai-Ning^1,3 

[1] Beijing Inst Technol, Inst Adv Struct Technol, State Key Lab Explos Sci & Technol, Beijing 100081, Peoples R China

[2] Tsinghua Univ, AML, CNMM, Dept Engn Mech, Beijing 100084, Peoples R China

[3] Peking Univ, Coll Engn, State Key Lab Turbulence & Complex Syst, Beijing 100871, Peoples R China

[4] China Automot Battery Res Inst Co Ltd, Beijing 100088, Peoples R China

[5] Chinese Acad Sci, Inst Mech, LNM, Beijing 100190, Peoples R China

关键词: Lithium ion batteries;    Silicon film;    Multi-beam optical sensor (MOS);    in situ stress measurement;    Colorimetric method;   

DOI  :  10.1016/j.jpowsour.2019.227227

来源: Elsevier

【 摘 要 】

Here an in situ system is presented to simultaneously study the evolution of both morphology and stress in the silicon thin film electrode during lithiation and delithiation. Owing to the specific design with two observation windows in the in situ cell, both the curvature and color of the silicon thin-film electrodes upon lithiation and delithiation processes can be measured by multi-optical sensor and optical microscope. By such colorimetric method, the color evolution can be used to represent the thickness of silicon thin film electrode, and the quantitative relationship can be obtained by in situ atomic force microscope and optical microscopy experiments. Combining the real thickness with Stoney equation, the accurate stress of the LixSi film can be obtained during the electrochemical cycles.

【 授权许可】

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