Microstructural degradation of silicon electrodes during lithiation observed via operando X-ray tomographic imaging

JOURNAL OF POWER SOURCES

卷:342

Article

Taiwo, Oluwadamilola O.¹  Paz-Garcia, Juan M.²  Hall, Stephen A.²  Heenan, Thomas M. M.¹  Finegan, Donal P.¹  Mokso, Rajmund³  Villanueva-Perez, Pablo³  Patera, Alessandra^3,4  Brett, Daniel J. L.¹  Shearing, Paul R.¹ 

[1] UCL, Dept Chem Engn, Electrochem Innovat Lab, London WC1E 7JE, England

[2] Lund Univ, Div Solid Mech, Lund, Sweden

[3] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland

[4] Ecole Polytech Fed Lausanne, Ctr Imagerie BioMed, CH-1015 Lausanne, Switzerland

关键词: X-ray CT;    Silicon electrode;    Lithiation;    Particle fracturing;    Degradation;   

DOI  :  10.1016/j.jpowsour.2016.12.070

来源: Elsevier

【 摘 要 】

Due to their high theoretical capacity compared to that of state-of-the-art graphite-based electrodes, silicon electrodes have gained much research focus for use in the development of next generation lithium-ion batteries. However, a major drawback of silicon as an electrode material is that it suffers from particle fracturing due to huge volume expansion during electrochemical cycling, thus limiting commercialization of such electrodes. Understanding the role of material microstructure in electrode degradation will be instrumental in the design of stable silicon electrodes. Here, we demonstrate the application of synchrotron-based X-ray tomographic microscopy to capture and track microstructural evolution, phase transformation and fracturing within a silicon-based electrode during electrochemical lithiation. (C) 2016 The Authors. Published by Elsevier B.V.

【 授权许可】

Free